Novelty detection
US7925470B2 · kind B2 · utility
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Key dates
| Filing date | Jul 11, 2008 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Oct 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/2433
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for detecting an abnormality in e.g. in operating characteristics or function of a machine, apparatus or system, the method including providing a data sample set comprising n values of a measured physical parameter associated with the apparatus or system generated by repeating a measurement of the physical parameter n times. An extremal measured parameter value is selected from amongst the data sample set, determining a probability of observing the selected parameter value (e.g. of observing a value not exceeding the selected parameter value) by applying the selected parameter value to an extreme value probability distribution function having a location parameter and a scale parameter. The value of the location parameter and the value of the scale parameter are each constructed using an integer value m (e.g. notionally representing the size of a sub-sample data set comprising m of said measured parameter values) in which m is less than n (i.e. m<n). A conditional indication is given that the selected parameter value is abnormal according to the value of the probability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.