Black-box host stack latency measurement
US7925741B2 · kind B2 · utility
1Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2007 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Feb 9, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/385
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method comprises sniffing an input from a client device to a host device and an output from the host device to the client device; recording a first time parameter in response to a characteristic data unit being inserted into the input that is outputted from a host stack of a host device; recording a second time parameter in response to the output that comprises the characteristic data unit being received by the host stack; and measuring a latency based on the first time parameter, the second time parameter and arrival time of the input and the output at a sniffing point.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.