Patent · US Active

Test compaction using linear-matrix driven scan chains

US7925941B2 · kind B2 · utility

7Cited by
11References
19Claims
0Family size

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Key dates

Filing dateAug 28, 2009
Grant dateApr 12, 2011
Priority date—
Expiry dateAug 28, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318547
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional techniques, without reducing fault coverage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.