Patent · US Active

Graphical analysis to detect process object anomalies

US7926026B2 · kind B2 · utility

58Cited by

10References

21Claims

0Family size

Assignee

SAP AG · DE

Inventors

Udo Klein · Maximiliansau, DE
Thomas Wieczorek · Meckesheim, DE
Daniel E. Zimmermann · Peoria, US
Oliver Sievi · Sandhausen, DE
Guenter Pecht-Seibert · Östringen, DE

Key dates

Filing date	Dec 20, 2006
Grant date	Apr 12, 2011
Priority date	—
Expiry date	Feb 9, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06F18/2433
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and system for graphical analysis to detect anomalies in process objects. The method generates a graph to represent a set of process objects, applies a clustering algorithm to cluster like nodes of the graph, compares the clusters to the process objects, and, if the objects match the clusters, accepts the objects for further review or for use in applications. If one or more of the objects do not match the clusters, such suggests that there are anomalies in the process objects requiring correction. An example implementation may be to detect anomalies in the design of the process objects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.