Method for classifying microelectronic dies using die level cherry picking system based on dissimilarity matrix
US7930266B2 · kind B2 · utility
26Cited by
4References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2006 |
| Grant date | Apr 19, 2011 |
| Priority date | — |
| Expiry date | Nov 5, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer implemented method for ordering a plurality of entities by computing a dissimilarity matrix based on a plurality of probabilities. The pluralities of probabilities are determined based on a plurality of classes. A weighted distance matrix is computed based the dissimilarity matrix. A plurality of rank ordered sequence candidates based at least in part on the sum of weighted distances between neighboring entities in the rank ordered sequence is calculated. Other embodiments are described in the claims.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.