Quantitative measurement of isotope ratios by time-of-flight mass spectrometry
US7932491B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 4, 2009 |
| Grant date | Apr 26, 2011 |
| Priority date | — |
| Expiry date | Jan 7, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass spectrometer includes a pulsed ion source that generates an ion beam comprising a plurality of ions. A first timed ion selector passes a first group of ions. A first ion mirror generates a reflected ion beam comprising the first group of ions that at least partially compensates for an initial kinetic energy distribution of the first group of ions. A second timed ion selector passes a second group of ions. A second ion mirror generates a reflected ion beam comprising the second group of ions that at least partially compensates for an initial kinetic energy distribution of the second group of ions. A timed ion deflector deflects the second group of ions to a detector assembly comprising at least two ion detectors which detects the deflected ion beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.