Method of inspection for inner defects of an object and apparatus for same
US7933441B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2005 |
| Grant date | Apr 26, 2011 |
| Priority date | — |
| Expiry date | Jan 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.