Patent · US Active

Automated analysis of datacenter layout using temperature sensor positions

US7933739B2 · kind B2 · utility

11Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 13, 2008
Grant dateApr 26, 2011
Priority date
Expiry dateFeb 8, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K1/026
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, methods, and software for analyzing the layout of computer equipment racks in a datacenter. One embodiment involves obtaining the position relative to the computer room of each of a plurality of temperature sensors distributed among a plurality of computer components mounted between opposing intake and exhaust ends of each computer equipment rack. The layout of the computer equipment racks is automatically determined from the positions of the temperature sensors, and a representation of the layout of the computer equipment racks is electronically stored or displayed. The actual layout is compared to target layout parameters to score the layout.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.