Extended measurement word determination at a channel subsystem of an I/O processing system
US7937507B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 14, 2008 |
| Grant date | May 3, 2011 |
| Priority date | — |
| Expiry date | Nov 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/124
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An article of manufacture, an apparatus, and a method for determining an extended measurement word at a channel subsystem of an I/O processing system using data from a control unit are provided. The article of manufacture includes at least one computer usable medium having computer readable program code logic. The computer readable program code logic performs a method including sending a command message to the control unit, and receiving a transport response information unit message at the channel subsystem in response to sending the command message to the control unit. The computer readable program code logic additionally extracts a plurality of time values from the transport response information unit message as calculated by the control unit, calculates an extended measurement word as a function of the time values, and writes the extended measurement word to computer readable memory in the I/O processing system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.