Non-destructive examination apparatus and method for guided waves
US7938008B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2007 |
| Grant date | May 10, 2011 |
| Priority date | — |
| Expiry date | Jun 27, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2623
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, producing a guided wave into the piece of material to be examined, wherein the guided wave is placed into the material through a synthetically changed incident angle, receiving the guided wave from the piece of material, and determining one of a presence of defects and lack of defects in the piece of material from the received guided wave. Transducers used may include 360 degree guided wave, radial polarized units, parallel shear units for shear horizontal activation and guided wave wheel probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.