Programmable logic device with built in self test
US7944765B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2009 |
| Grant date | May 17, 2011 |
| Priority date | — |
| Expiry date | Feb 3, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment of the invention, an integrated circuit such as a programmable logic device includes volatile memory, nonvolatile memory, and a data shift register for reading data from the nonvolatile memory and for reading data from and writing data to the volatile memory. A built in self test (BIST) circuit is operable to test the nonvolatile memory without the data shift register reading data from the nonvolatile memory. The BIST circuit may include a finite state machine for performing at least one of the following tests on the nonvolatile memory: bulk erase, bulk program; margin bulk program; and/or margin bulk erase. A memory controller responsive to the finite state machine is operable to write data to and read data from the nonvolatile memory during testing of the nonvolatile memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.