X-ray system and method for tomosynthetic scanning
US7945014B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 26, 2007 |
| Grant date | May 17, 2011 |
| Priority date | — |
| Expiry date | Sep 26, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an x-ray system and a method for tomosynthetic scanning of a subject, x-ray radiation is emitted from two x-ray sources that are panned along a line relative to the subject during a tomosynthetic scan. The two x-ray sources are located next to each other along the line, and each emit an x-ray beam. X-rays from the two parallel beams attenuated by the subject are detected by a two-dimensional x-ray detector, that is substantially stationary during the tomosynthetic scan.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.