Absolute position measurement apparatus
US7945420B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 9, 2008 |
| Grant date | May 17, 2011 |
| Priority date | — |
| Expiry date | Apr 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/2457
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An absolute position measurement apparatus includes an output unit, a phase computing unit, a regression computing unit, a phase difference computing unit, an origin position computing unit, and an absolute position calculating unit. The output unit outputs first signals and superimposed signals formed by superimposing second signals on the first signals. The first signals relate to a position of an object to be measured and the first and second signals have a different cycle. The phase computing unit calculates the phase of the first and second signals. The regression computing unit calculates a regression coefficient of the phase of the first signals. The phase difference computing unit calculates a phase difference between phases of the first and second signals. The origin position computing unit determines an origin position of the object to be measured. The absolute position calculating unit calculates an absolute position of the object to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.