Patent · US Active

Manufacturing-side calibration of a measuring device for capacitive fill level measurement, and corresponding measuring device

US7946148B2 · kind B2 · utility

5Cited by

4References

6Claims

0Family size

Assignee

ENDRESS+HAUSER GMBH+CO.KG · DE

Inventors

Igor Getman · Lörrach, DE
Armin Wernet · Rheinfelden (Baden), DE
Roland Dieterle · St. Georgen, DE
Kaj Uppenkamp · Wehr, DE

Key dates

Filing date	Sep 13, 2005
Grant date	May 24, 2011
Priority date	—
Expiry date	Aug 2, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01F25/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for manufacturing-side calibration of a measuring device for capacitive fill level measurement of a medium, wherein at least one probe unit of the measuring device is activated with an electrical, alternating voltage of a predeterminable frequency. As a function of the frequency of the activating signal, a conductivity range is determined, within which the fill level measurement is essentially independent of a change of the electrical conductivity of the medium; for such conductivity range, at least a first reference matching between a predeterminable, first fill-level value and a first capacitance value belonging to the first fill-level value is produced; and the first reference matching between the first fill-level value and the first capacitance value is recorded. Additionally, the invention relates to a corresponding measuring device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.