Glide test heads using heating elements to form a planar detection surface
US7946156B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 26, 2007 |
| Grant date | May 24, 2011 |
| Priority date | — |
| Expiry date | Sep 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/3136
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording disk. The glide test head includes a detection pad on the trailing end of the head. Heating elements are fabricated proximate to the detection pad. The heating elements are independently controllable to control the amount of protrusion of different regions of the detection pad. The heating elements thus provide a way to substantially flatten the detection surface of the detection pad, and compensate for an uneven topography on a detection surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.