Method and kit for calibrating a photoluminescence measurement system

US7947502B2 · kind B2 · utility

Assignees

• Sigma-Aldrich Co. LLC · US
• BAM Bundesanstalt fuer Materialforschung und-pruefung · DE

Inventors

• Ute Resch-Genger · Berlin, DE
• Dietmar Pfeifer · Berlin, DE
• Christian Monte · Berlin, DE
• Angelika Hoffmann · Berlin, DE
• Pierre Nording · Buchs, CH
• Bernhard Schönenberger · Buchs, CH
• Katrin Hoffmann · Berlin, DE
• Monika Spieles · Berlin, DE
• Knut Rurack · Berlin, DE

Key dates

• Filing date: Mar 23, 2010
• Grant date: May 24, 2011
• Expiry date: Mar 23, 2030

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10T436/108331
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.