Guide device and test apparatus for electronic devices
US7948251B2 · kind B2 · utility
0Cited by
5References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2008 |
| Grant date | May 24, 2011 |
| Priority date | — |
| Expiry date | May 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2867
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a guide device comprising a baseplate unit having formed therein a guide channel for guiding electronic devices, wherein at least two portions of the baseplate unit are spatially fixed, said guide device being characterized in that means for compensating the thermal expansion of the baseplate unit are provided. The invention additionally relates to a test apparatus which comprises the guide device according to the present invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.