Compensating for time varying phase changes in interferometric measurements
US7948633B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2010 |
| Grant date | May 24, 2011 |
| Priority date | — |
| Expiry date | Aug 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.