Control apparatus and method for controlling measuring devices to test electronic apparatuses
US7949899B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 17, 2008 |
| Grant date | May 24, 2011 |
| Priority date | — |
| Expiry date | Feb 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/319
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronic apparatus testing method is provided. The method includes the step of: reading a product ID of the electronic apparatus when the electronic apparatus is connected to a control apparatus; determining the device type ID from the product ID, wherein the product ID comprises basic information of the electronic apparatus, determining the script files of the functions of the electronic apparatus in the testing table according to the device type ID; obtaining the script files from a data storage and running the script files to test functions of the electronic apparatuses, sending a control instruction to the corresponding measuring device of the function to control the measuring device test the function during the process of running the script files; and displaying test results through a display of the control apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.