Analysis system and method for analyzing a sample on an analytical test element

US7951331B2 · kind B2 · utility

Assignee

• Roche Diagnostics Operations, Inc. · US

Inventors

• Bernd Roesicke · Mannheim, DE
• Stefan Kalveram · Viernheim, DE
• Frederic Wehowski · Hockenheim, DE
• Michael Goetz · Reichelsheim, DE

Key dates

• Filing date: Jul 11, 2007
• Grant date: May 31, 2011
• Expiry date: Mar 29, 2030

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10T436/110833
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.