Patent · US Active

Waveplate analyzer based on multiple tunable optical polarization rotators

US7952711B1 · kind B1 · utility

4Cited by

109References

14Claims

0Family size

Assignee

General Photonics Corporation · US

Inventors

Xiaojun Chen · Shanghai, CN
Lianshan Yan · Los Angeles, US
Xiaotian Steve Yao · Diamond Bar, US

Key dates

Filing date	Mar 26, 2008
Grant date	May 31, 2011
Priority date	—
Expiry date	Mar 28, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/23
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems, apparatus and methods for characterizing linear retarders using a waveplate analyzer constructed by polarization rotators. In one implementation of such an analyzer, both the retardation of the waveplate sample and the orientation of optical axis of the waveplate sample can be simultaneously measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.