Microscopic-measurement apparatus
US7954069B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 2008 |
| Grant date | May 31, 2011 |
| Priority date | — |
| Expiry date | Oct 19, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/365
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.