Symbol rate testing method based on signal waveform analysis
US7957459B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2007 |
| Grant date | Jun 7, 2011 |
| Priority date | — |
| Expiry date | Apr 6, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/0262
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bits 1 and a plurality of quasi bits 0 is received and sampled within an acquiring time. Maximum values of the quasi bits 1 are obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bit 1 is a bit 1 or not is determined according to the critical value, and a total number of the bits 1 within the acquiring time is counted. Similarly, a number of the bits 0 within the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.