Second ion mass spectrometry method and imaging method
US7960691B2 · kind B2 · utility
1Cited by
2References
13Claims
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Key dates
| Filing date | Jun 13, 2007 |
| Grant date | Jun 14, 2011 |
| Priority date | — |
| Expiry date | Mar 11, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.