Method of setting reference data for inspection of fillets and inspection device using same
US7961933B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2007 |
| Grant date | Jun 14, 2011 |
| Priority date | — |
| Expiry date | Apr 12, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30152
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.