Patent · US Active

Distortion evaluating apparatus and distortion evaluating method

US7962303B2 · kind B2 · utility

2Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 11, 2006
Grant dateJun 14, 2011
Priority date
Expiry dateApr 21, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2200/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A distortion evaluating apparatus which can quantitatively evaluate distortion in a measurement object surface is provided. A distortion evaluating apparatus evaluates distortion based on three-dimensional measurement data obtained from a measurement object surface. The apparatus includes a secondary differential component adapted for effecting a secondary differential operation on two-dimensional measurement data of a cross section of the measurement object surface indicative of unevenness therein, thus obtaining curvature data of the cross section, a permissible range setting component adapted for setting a permissible range for the curvature data, based on range of an upper limit value and a lower limit value from a reference value, and a distortion data extracting means component adapted for extracting a portion of the curvature data exceeding the set permissible range as distortion data indicative of the distortion in the cross section.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.