Word line defect detecting device and method thereof
US7965577B2 · kind B2 · utility
11Cited by
4References
6Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 18, 2009 |
| Grant date | Jun 21, 2011 |
| Priority date | — |
| Expiry date | Mar 9, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method for detecting word line defect includes activating a first word line for reading a first data pre-stored in the memory cell, suspending the first word line for a predetermined period and then writing a second data complementary to the first data into the memory cell, activating again the first word line for reading a third data from the memory cell, and comparing the second and the third data for determining if an electrical coupling path exists between the first word line and a second word line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.