System and method for testing LEDs on a motherboard
US7965884B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 24, 2007 |
| Grant date | Jun 21, 2011 |
| Priority date | — |
| Expiry date | Apr 19, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary method and system for testing light-emitting diodes (LEDs) uses a camera module to take two bulb images of transparent bulbs connected to each of the LEDs. A first bulb image is captured when the LEDs are set in a power-on state, and a second bulb image is captured when the LEDs are set in a power-off state. The method divides each of the two bulb images into small pictures, and calculates an average pixel value of each of the small pictures. After calculating a first difference of each of the small pictures between the average pixel value and a first predetermined value, and a second difference of each of the small pictures between the average pixel value and a second predetermined value, the method ascertains a present state of each of the LEDs by comparing the two differences.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.