Method for evaluating and correcting total measurement signals

US7966141B2 · kind B2 · utility

Assignee

• ENDRESS+HAUSER GMBH+CO.KG · DE

Inventors

• Dietmar Spanke · Steinen, DE
• Edgar Schmitt · Lambach, DE
• Holger Steltner · Eßlingen, DE
• Alexey Malinovskiy · Maulburg, DE

Key dates

• Filing date: Nov 9, 2005
• Grant date: Jun 21, 2011
• Expiry date: Nov 13, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01F23/2962
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An improved and more accurate method for evaluating and correcting total measurement signals (TS(n)) of measuring devices. The invention concerns a method for evaluating and correcting total measurement signals (TS(n)) of a measuring device, wherein measuring signals are transmitted in the direction of a medium and reflected on a surface of the medium as wanted echo signals or on a surface of a disturbing element as interference signals and received. In the case of a modification of at least one technical, process condition in the container and/or a modification of at least one technical, measurement condition of the measuring device, an independent reference curve is ascertained on the basis of a current static reference curve, wherein the interference signals are masked out of the raw echo curve on the basis of a masking algorithm, which applies the independent reference curve.