High temperature gate drivers for wide bandgap semiconductor power JFETs and integrated circuits including the same
US7969226B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 7, 2009 |
| Grant date | Jun 28, 2011 |
| Priority date | — |
| Expiry date | Jan 19, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2017/6875
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Gate drivers for wide bandgap (e.g., >2 eV) semiconductor junction field effect transistors (JFETs) capable of operating in high ambient temperature environments are described. The wide bandgap (WBG) semiconductor devices include silicon carbide (SiC) and gallium nitride (GaN) devices. The driver can be a non-inverting gate driver which has an input, an output, a first reference line for receiving a first supply voltage, a second reference line for receiving a second supply voltage, a ground terminal, and six Junction Field-Effect Transistors (JFETs) wherein the first JFET and the second JFET form a first inverting buffer, the third JFET and the fourth JFET form a second inverting buffer, and the fifth JFET and the sixth JFET form a totem pole which can be used to drive a high temperature power SiC JFET. An inverting gate driver is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.