Geometric measurement system and method of measuring a geometric characteristic of an object
US7969585B2 · kind B2 · utility
9Cited by
23References
17Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 6, 2009 |
| Grant date | Jun 28, 2011 |
| Priority date | — |
| Expiry date | Nov 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0271
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.