Multiplex near-field microscopy with diffractive elements
US7969650B2 · kind B2 · utility
8Cited by
7References
43Claims
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Key dates
| Filing date | Apr 28, 2006 |
| Grant date | Jun 28, 2011 |
| Priority date | — |
| Expiry date | Jul 12, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0068
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A near-field microscope using one or more diffractive elements placed in the near-field of an object to be imaged. A diffractive covers the entire object, thus signal may thereby be gathered from the entire object, and advantageously increase the signal-to-noise ratio of the resulting image, as well as greatly improve the acquisition speed. Near-field microscopy overcomes the limitation of conventional microscopy in that subwavelength and nanometer-scale features can be imaged and measured without contact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.