In-circuit testing for integrity of solid-state switches
US7973533B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2008 |
| Grant date | Jul 5, 2011 |
| Priority date | — |
| Expiry date | Mar 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3277
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A switching and fault detection circuit comprises two controllable switches capable of coupling a power source to a load. A controller can control the switches and test them for faults, and a voltage sensor can read the output voltage going to the load. Dual-redundant switches and fault detection circuitry can provide correct operation if one should fail. Control and feedback logic can determine if each of the solid-state switches is operating correctly during the power-on and power-off cycles and can also check for a fail-open condition during normal operations. If it is determined that a solid switch has failed open or closed, a fault can be generated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.