Patent · US Active

Method and system for crystallization and X-ray diffraction screening

US7974380B2 · kind B2 · utility

4Cited by
6References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 9, 2008
Grant dateJul 5, 2011
Priority date
Expiry dateFeb 9, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/20025
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated fluidic circuit includes a substrate layer and a first structure coupled to the substrate layer and including a plurality of channels. The first structure is configured to provide for flow of one or more materials through the plurality of channels. The integrated fluidic circuit also includes a second structure coupled to the substrate layer. The second structure includes a plurality of control channels configured to receive an actuation pressure. The integrated fluidic circuit is characterized by a thickness of less than 1.5 mm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.