Image sensor and method
US7974805B2 · kind B2 · utility
2Cited by
64References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 14, 2008 |
| Grant date | Jul 5, 2011 |
| Priority date | — |
| Expiry date | Jan 3, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Described herein are methods that may improve yield of an image sensor. In one embodiment, a method that may improve yield of an image sensor includes generating output values of control logic associated with an array of light sensitive elements. The method further may include determining if the control logic has one or more faulty output values. The method further may include automatically correcting the one or more faulty output values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.