Patent · US Active

Nonvolatile memory device comprising a programming and deletion checking option

US7975191B2 · kind B2 · utility

1Cited by

9References

23Claims

0Family size

Assignee

Micronas GmbH · DE

Inventors

Manfred Ullrich · Bensberg, DE
Martin Bayer · Hessisch Oldendorf, DE
Hans-Jörg Fink · Glückstadt, DE
Reiner Bidenbach · Vaterstetten, DE
Thilo Rubehn · Gundelfingen, DE

Key dates

Filing date	May 4, 2006
Grant date	Jul 5, 2011
Priority date	—
Expiry date	Oct 13, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/0409
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and circuitry for checking the programming (P) and deletion (L) operations of memory cells (5) in a nonvolatile memory device (1). Parallel to the programming (P) or deletion (L) operations of the actual memory cells (5) the respective programming or deletion process is carried out on at least one similar checking cell (4.1, 4.2, 4.3), with the programming (P) or deletion (L) operations being less favorable by a defined extent than the programming (P) or deletion (L) operations of the actual memory cells (5). From the content of the checking cell (4.1, 4.2, 4.3) an evaluation device (6) determines whether the programming (P) or deletion (L) operation was successful or not, and a corresponding output signal (ak) indicative thereof is produced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.