Patent · US Active

3D photogrammetry using projected patterns

US7978892B2 · kind B2 · utility

7Cited by

3References

12Claims

0Family size

Assignee

D4D Technologies, LLC · US

Inventors

Mark Quadling · Plano, US
Henley Quadling · Addison, US
Ye Li · Plano, US
Andrei Tchouprakov · Plano, US

Key dates

Filing date	Oct 24, 2007
Grant date	Jul 12, 2011
Priority date	—
Expiry date	May 11, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06V10/145
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A structured light pattern digitizing method is combined with photogrammetry to determine a 3D model of an object. The structured light digitizing operation generates a 3D model of the object being scanned, and this model is then used to compute a higher accuracy model using photogrammetry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.