System and method for automatic calibration
US7981678B2 · kind B2 · utility
1Cited by
41References
26Claims
0Family size
Assignee
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Key dates
| Filing date | May 29, 2008 |
| Grant date | Jul 19, 2011 |
| Priority date | — |
| Expiry date | May 30, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/112499
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device includes a sensor array and a processor is automatically calibrated. The sensor array collects data from a pattern using at least one of a capacitive measurement and a radio frequency measurement. The pattern is included on a calibration storage device. The processor receives the data from the sensor array and calibrates the device in accordance with the data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.