Conduction-cooled accelerated test fixture
US7982476B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2009 |
| Grant date | Jul 19, 2011 |
| Priority date | — |
| Expiry date | May 24, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2817
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment of the invention, a testing apparatus for executing highly accelerated life testing on at least one test subject includes at least one structure operable to thermally stress the test subject via conduction and at least one pneumatic hammer operable to input imparting vibrations to the test subject. According to another embodiment of the invention, a method for executing highly accelerated life testing of at least one test subject includes applying a thermal stress to the test subject via conduction at a rate of change of at least 8° C. per minute and imparting vibrations to the test subject at a rate of at least 3 Gs rms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.