Patent · US Active

Residual chemical monitoring system using surface enhanced raman spectroscopy

US7982872B2 · kind B2 · utility

2Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 23, 2010
Grant dateJul 19, 2011
Priority date
Expiry dateAug 23, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8557
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Target chemicals are monitored at very low concentrations in pipelines or vessels such as storage tanks using surface enhanced Raman spectroscopy analysis of a sample. A liquid sample having a target chemical such as biocides, corrosion inhibitors, scale inhibitors, anti-foaming agents, emulsion breakers, and hydrate inhibitors are tested while exposed to a prepared and charged surface of a coupon so as to draw the target material to the prepared and charged surface. The charged surface is fairly precisely charged using two other electrodes to calibrate the charge on the surface of the coupon. With the target substance presumably drawn to the coupon, the molecules on the surface of the coupon are excited by monochromatic light such as from a laser to induce vibrations within the molecules. The vibrations of the molecules reflect and scatter the monochromatic light in distinctive manners such that the collected light from the surface provides an indication of the presence of the target substance in the sample and a quantitative indication of the concentration of the target material in the sample. With the ability at lower power and reasonable cost to sense the presence well down bel…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.