X-ray CT system for x-ray phase contrast and/or x-ray dark field imaging

US7983381B2 · kind B2 · utility

Assignees

• Siemens Aktiengesellschaft · DE
• Paul Scherrer Institut · CH

Inventors

• Christian David · Lauchringen, DE
• Tilman Donath · Brugg, CH
• Eckhard Hempel · Bad Mergentheim, DE
• Martin Hoheisel · Erlangen, DE
• Franz Pfeiffer · Unterföhring, DE
• Stefan Popescu · Erlangen, DE

Key dates

• Filing date: Sep 30, 2009
• Grant date: Jul 19, 2011
• Expiry date: Nov 30, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An x-ray CT system for x-ray phase contrast and/or x-ray dark field imaging has a grating interferometer that has a first grating structure that has a number of band-shaped x-ray emission maxima and minima arranged in parallel, the maxima and minima exhibiting a first grating period, a second band-shaped grating structure that produces, as a phase grating, a partial phase offset of x-ray radiation passing therethrough and that exhibits a second grating period, a third band-shaped grating structure with a third grating period with which relative phase shifts of adjacent x-rays and/or their scatter components are detected, and a device for value-based determination of the phase between adjacent x-rays and/or for value-based determination of the spatial intensity curve per detector element perpendicular to the bands of the grating structures. The third grating structure has a grating period that is larger by a factor of 2 to 5 than the grating period of the first grating structure.