Patent · US Active

System and method for material segmentation utilizing computed tomography scans

US7983382B2 · kind B2 · utility

4Cited by

6References

20Claims

0Family size

Assignee

General Electric Company · US

Inventors

Brian William Thomsen · Milwaukee, US
John Lawrence Seamans · Ann Arbor, US

Key dates

Filing date	Nov 26, 2008
Grant date	Jul 19, 2011
Priority date	—
Expiry date	Mar 10, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG06T2211/408
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Certain embodiments provide a radiation analysis system for material segmentation utilizing computed tomography (CT) scans. The radiation analysis system includes an input module configured to input dual energy data. The dual energy scanned data includes first data corresponding to a first parameter and second data corresponding to a second parameter for a given scanned volume. The radiation analysis system also includes a processor configured to generate a scatter plot based on the dual energy data. The first data corresponds to a first axis and the second data corresponds to a second axis. The processor is configured to identify at least one material type based on the scatter plot.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.