Method and system to predict detectability and identify foreign objects
US7983387B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2009 |
| Grant date | Jul 19, 2011 |
| Priority date | — |
| Expiry date | Mar 13, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The different advantageous embodiments provide a system for identifying a likelihood of detecting objects with a backscatter x-ray system comprising a structure having a number of objects, a plurality of databases, and a processor unit configured to execute a detection analysis process. The processor unit executes the detection analysis process to identify the number of objects, identify a number of densities associated with each of the number of objects, determine a likelihood of detecting each of the number of objects with the backscatter x-ray system, and generate a three-dimensional diagram of the likelihood of detecting each of the number of objects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.