Method of measuring the three-dimensional profile of a ground, and device for implementing said method
US7984646B2 · kind B2 · utility
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6References
6Claims
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Key dates
| Filing date | Dec 12, 2006 |
| Grant date | Jul 26, 2011 |
| Priority date | — |
| Expiry date | May 29, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the profile, in three dimensions, of a pavement on which vehicles fitted with at least one tire may run. A first topographical measurement is carried out on site with a precision of at least one millimeter of an elementary surface of said pavement, then the points of contact between said surface and the tread of a given tire are defined and at least a second topographical measurement of said points of contact is carried out on site so as to obtain a three-dimensional representation, with a resolution of the order of one micron, of the microroughness of said points of contact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.