Method for recording an examination object
US7986762B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 24, 2010 |
| Grant date | Jul 26, 2011 |
| Priority date | — |
| Expiry date | Aug 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for recording an examination object using an x-ray recording system having an x-ray source and an x-ray detector rotatable about a common axis of rotation. X-ray detector is displaced in a first direction enclosing a first angle k between a perpendicular bisector from x-ray source to x-ray detector and a plane running through x-ray source and containing the axis, k≠0. First x-ray images are recorded in angular positions of x-ray source and x-ray detector displaced in the first direction in a first rotation. X-ray detector is displaced in a second direction enclosing a second angle m between the bisector and the plane, m≠0 and is on an opposite side from k. Starting points of the rotations are differed by an angle of displacementwhere d is the detector fan angle. Starting points and finishing points of the rotations are spanned by π+β0.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.