Cleaned daughter ion spectra from maldi ionization
US7989759B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 24, 2008 |
| Grant date | Aug 2, 2011 |
| Priority date | — |
| Expiry date | Jun 26, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0045
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In a mass spectrometer having an ion source in which analyte substances are ionized by matrix assisted laser desorption and form an ion beam that travels to a parent ion selector for selecting ions to form daughter ions, the ion beam is reflected in at least one reflector prior to the parent ion selector so that only ions that have both the mass of the parent ions and their kinetic energy are allowed to pass to the parent ion selector. By taking this measure, the mass resolution in the daughter ion spectra is also increased; the improved mass resolution and improved signal-to-noise ratio produce higher sensitivity, even though fewer ions are admitted for analysis in the daughter ion spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.