Systems and methods for storage channel testing
US7990642B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2009 |
| Grant date | Aug 2, 2011 |
| Priority date | — |
| Expiry date | Nov 3, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.