Patent · US Active

Benchmarking diagnostic algorithms

US7991580B2 · kind B2 · utility

2Cited by

19References

18Claims

0Family size

Assignee

HONEYWELL INTERNATIONAL INC. · US

Inventors

Lokesh Kumar Sambasivan · Tirupati, IN
Joydeb Mukherjee · Bengaluru, IN
Dinkar Mylaraswamy · Fridley, US

Key dates

Filing date	Apr 16, 2008
Grant date	Aug 2, 2011
Priority date	—
Expiry date	Jan 26, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG05B23/0297
WIPO fieldControl
WIPO sectorInstruments

Abstract

A method for benchmarking diagnostic algorithms for a particular application is provided. The diagnostic algorithms are rank ordered based on a specified criterion so as to weed out weak algorithms, selecting more robust algorithms, defined in some sense, for deployment. This is realized by evaluating various parameters subsequently mentioned. A normalized product entropy ratio parameter is obtained. A performance parameter vector is fixed to define a plurality of sensitivity parameters including a plurality of threshold parameters and a plurality of data parameters. The plurality of threshold parameters and the plurality of data parameters are perturbed to obtain a threshold sensitivity parameter and a data sensitivity parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.