Test system with simulation control device for testing functions of electronic devices
US7992046B2 · kind B2 · utility
1Cited by
11References
13Claims
0Family size
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Key dates
| Filing date | Dec 7, 2008 |
| Grant date | Aug 2, 2011 |
| Priority date | — |
| Expiry date | Aug 28, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/261
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test system for testing various functions of electronic devices includes a master device and a simulation control device. The master device is connected to an input device and the electronic devices through the simulation control device. The master device records input signals of the input device and generate simulation signals according to the input signals. The simulation control device simulates the input signals of the input device according to the simulation signals to test the electronic devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.