Optical alignment of cameras with extended depth of field
US7999851B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 2008 |
| Grant date | Aug 16, 2011 |
| Priority date | — |
| Expiry date | Dec 5, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for calibration of an imaging device that includes a sensor and optics for forming an image on the sensor. The method includes making a first image quality measurement, based on an output of the sensor, while imaging a first target at a first distance from the device and varying an offset between the optics and the sensor. A second image quality measurement is made while imaging a second target at a second distance from the device, which is different from the first distance, and varying the offset between the optics and the sensor. A working point of the optics is set relative to the sensor responsively to the first and second image quality measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.